Assembly & Packaging
Die attach, encapsulation and leadframe/substrate processing for power and standard packages.
- Die attach with void control
- Molding and encapsulation
- Lead-free finish options
Backend Division
Assembly, packaging, test and reliability — turning sorted wafers into devices ready for the field.
Overview
Backend is where a proven die becomes a deliverable device. Wafers arriving from the frontend fab are die-sorted, then flow through die attach, interconnection and encapsulation before final electrical test. The division covers both standard package families and the power-specific builds — modules with multiple dies, baseplates and interconnects — that the RifSol power portfolio depends on.
Two interconnection technologies anchor the line. Wire bonding remains the workhorse for power and standard packages, with aluminum and copper systems tuned for current capability. Flip-chip packaging is deployed where inductance, footprint or thermal performance demand direct die-to-substrate connections. Both are supported by in-line inspection at every critical station.
Qualification is the real product of backend. Every device family passes burn-in and screening designed to precipitate infant mortality, plus reliability programs — temperature cycling, humidity, lifetime stress — aligned to the automotive and industrial quality systems of the platform. Failure analysis closes the loop: any field or test escape returns as a documented physical root cause, feeding both process and design.
Beyond wire bonding and flip-chip, the division operates an advanced-integration program built on three pillars. System-in-Package (SiP) combines several dies — logic, power, RF — with passives inside a single molded package. Chiplet integration places known-good dies side by side on a substrate or interposer and connects them with die-to-die interconnects, so a product is assembled from qualified building blocks instead of one monolithic die. And HBM rework covers the high-value end of the flow: controlled removal of a high-bandwidth-memory stack from its interposer or substrate, inspection of the underlying joints, and re-attachment of a known-good stack — recovering assemblies whose logic die is perfect but whose memory was not.
3
Integration flows — wire · flip-chip · D2D
100%
Units final-tested
SiP
System-in-Package capability
HBM
Stack rework capability
Capabilities
Die attach, encapsulation and leadframe/substrate processing for power and standard packages.
Aluminum and copper wire bonding plus flip-chip interconnect for low-inductance, high-current designs.
Multi-die power modules with integrated baseplates, substrates and thermal interfaces.
Final electrical test, marking and visual inspection gate every unit before packing.
Statistical burn-in and ESD screening designed to remove infant-mortality failures before shipment.
Qualification programs and physical failure analysis that turn escapes into engineering fixes.
Multi-die System-in-Package integration: logic, power, RF and passives combined in one package.
Heterogeneous integration of known-good chiplets on substrates and interposers with die-to-die interconnect.
Controlled removal, inspection and re-attachment of HBM stacks — recovering high-value assemblies instead of scrapping them.
How it works
Every die on the incoming wafer is electrically sorted; only known-good die proceed.
Dies are attached to leadframes or substrates with controlled bond-line and void limits.
Wire bonds, flip-chip bumps or die-to-die connections form the electrical pathways.
Molding protects the die and bonds from moisture, stress and contamination.
Parametric and functional test confirms each unit meets its specification.
Screening removes infant failures; qualified units are marked and packed.
Why it matters
A power module that survives automotive qualification does not happen by inspection — it happens by design of the assembly process. Sintered die attach, wire-bond loop profiles and substrate choices are engineered together with the IC Design Center so that thermal cycling, power cycling and humidity stress become pass/fail checkpoints, not surprises. The same discipline now extends to advanced integration: a chiplet package or a reworked HBM stack faces the full qualification flow before it ships.
Where it goes
Multi-die modules for EV traction, drives and renewable-energy inverters.
Chiplet, SiP and HBM-related integration for compute-hungry platforms.
Qualification flows aligned to IATF 16949 expectations for automotive electronics.
MOSFET, IGBT and rectifier packages for drives, supplies and converters.
From engineering programs to production partnership — the Backend team is one message away.